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Dual-Axis Precision Turntable with Integrated Thermal Chamber Delivers ±3 Arc-Second Accuracy and 500°/s Rate for Combined Environmental and Motion Testing

This dual-axis turntable integrates a -55°C to 125°C thermal chamber with ±3 arc-second positioning accuracy and 500°/s inner-axis rate. Featuring a φ500 mm table, 30 kg load capacity, 0.36 arc-second resolution, and 25-channel slip ring, it delivers combined thermal and dynamic testing for inertial sensors, optoelectronic devices, and navigation components.
Jul 3rd,2026 9 Views



Temperature changes everything—except the accuracy of this turntable.

 Accuracy That Never Wavers

±3 arc-second positioning accuracy and ±1 arc-second repeatability ensure your test data remains trustworthy, whether at -55°C or +125°C. With 0.36 arc-second resolution, even the finest angular adjustments are executed with precision.

 Boundless Rotation, Unlimited Possibilities

Continuous infinite rotation on both axes eliminates mechanical constraints, enabling uninterrupted multi-turn testing for comprehensive attitude profiling and extended endurance runs.

 Speed and Power When You Need It

Inner axis reaches 500°/s with 400°/s² acceleration; outer axis delivers 360°/s with 150°/s² acceleration. Speed resolution of 0.0005°/s allows fine-grained control, from ultra-low drift characterization to aggressive dynamic sweeps.

 Rate Stability Across the Entire Range

Rate accuracy and stability scale intelligently: ≤2×10⁻³ over 1° average for low speeds, ≤2×10⁻⁴ over 10° average for medium speeds, and ≤2×10⁻⁵ over 360° average at full speed—ensuring artifact-free motion at every operating point.

 Built to Withstand Extremes

The integrated thermal chamber, with internal dimensions of at least 600×600×500 mm, spans -55°C to +125°C. Temperature deviation and uniformity are maintained within ±2°C, while heating and cooling rates reach 2°C/min across the entire range. This allows simultaneous thermal stress and angular motion—eliminating the uncertainties of transferring test articles between separate systems.

 Stable Foundation for Sensitive Devices

The φ500 mm work surface supports 30 kg loads with 0.02 mm flatness and 0.03 mm runout. Two-axis intersection stays within φ0.5 mm, with perpendicularity maintained at ≤±3 arc-seconds—ensuring your device sits on a stable, repeatable reference.

 Built for Demanding Applications

Inertial navigation system calibration. Gyroscope and accelerometer characterization. Optoelectronic device verification. Aerospace sensor validation. Production quality assurance. Any scenario where combined thermal and angular testing is non-negotiable.

 The Complete Environmental Test Platform

By unifying high-accuracy dual-axis positioning, wide-range thermal conditioning, and robust mechanical construction, this turntable eliminates cross-platform handling errors and accelerates development cycles. For engineers who need to qualify sensors across both temperature extremes and dynamic motion, it delivers confidence—in every degree, at every degree.\

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